Optical Characterization Paradigm era
Otto S. Heavens (1950s) laid the foundational theory of optical properties of thin films, showing how interference in multilayer stacks encodes the refractive index and extinction coefficient. This era advanced practical metrology by tying spectroscopic reflectance and transmittance data to film thickness through interference models. H. A. MacLeod (1970s–1980s) codified standardized measurement protocols and designed coatings while writing influential texts that consolidated methods for extracting optical constants from measurements. E. D. Palik’s mid-1980s Handbook of Optical Constants of Solids supplied essential reference data for materials, enabling predictive thin-film design and the linkage of deposition parameters to optical performance.